GIGA FORCE

Failure Analysis Lab was founded in 2016, equipped with advanced and sophisticated precise instruments, brings high quality failure analysis in semiconductors, microelectronics, automotive, medical devices, telecommunications, electronics, aerospace, and computers to our customers

Non-Destructive Analysis

3D Microscope
2D/3D Xray
SAT
IV curve

Electrical Properties Analysis

Probe Station
Precise Instrument

Electrical Failure Analysis

InGaAs
OBIRCH
Thermal
NanoPrbing

Physical Failure Analysis

Chemical Decap
Cross Section Polish
Grinding
Delayering

Sample Inspection

Material Analysis

Chemical Element Analysis
Crystal Structure Analysis
Dopant Concentrtion Analysis

Final Comprehensive Report

Testing Data Collection
Conclusion

SEM Dual Beam FIB FIB CKT

Basic Technology Center